A simple tool for quality evaluation of the...

Thin Solid Films 2008 Vol. 516; Iss. 15

A simple tool for quality evaluation of the microcrystalline silicon prepared at high growth rate

J. Kočka, T. Mates, M. Ledinský, H. Stuchlíková, J. Stuchlík, A. Fejfar
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
516
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2007.09.052
File:
PDF, 367 KB
english, 2008
Conversion to is in progress
Conversion to is failed