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Examining Dislocations in SiC Epitaxy by Light Emission from Simple Diode Structures
Liu, Kendrick X., Stahlbush, Robert E., Hobart, Karl D., Sumakeris, Joseph J.Volume:
527-529
Year:
2006
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.527-529.387
File:
PDF, 278 KB
english, 2006