The method of total internal reflection ellipsometry for...

Thin Solid Films 2008 Vol. 516; Iss. 24

The method of total internal reflection ellipsometry for thin film characterisation and sensing

Alexei Nabok, Anna Tsargorodskaya
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Volume:
516
Year:
2008
Language:
english
Pages:
9
DOI:
10.1016/j.tsf.2007.11.077
File:
PDF, 1.03 MB
english, 2008
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