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A 60 dB SNDR 35 MS/s SAR ADC With Comparator-Noise-Based Stochastic Residue Estimation
Verbruggen, Bob, Tsouhlarakis, Jorgo, Yamamoto, Takaya, Iriguchi, Masao, Martens, Ewout, Craninckx, JanYear:
2015
Language:
english
Journal:
IEEE Journal of Solid-State Circuits
DOI:
10.1109/JSSC.2015.2422781
File:
PDF, 2.03 MB
english, 2015