Evaluation of residual stresses in thin films by critical...

Evaluation of residual stresses in thin films by critical buckling observation of circular microstructures and finite element method

Yi-Ting Yu, Wei-Zheng Yuan, Da-Yong Qiao, Qing Liang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
516
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.tsf.2007.12.153
File:
PDF, 941 KB
english, 2008
Conversion to is in progress
Conversion to is failed