The band-gap energy dependence of metal oxides on...

Microelectronic Engineering 2015 / 11 Vol. 147

The band-gap energy dependence of metal oxides on non-linear characteristics in the HfO2-based resistive random access memory

Lee, Sangheon, Lee, Daeseok, Woo, Jiyong, Cha, Euijun, Park, Jaesung, Moon, Kibong, Song, Jeonghwan, Hwang, Hyunsang
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Volume:
147
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2015.04.120
Date:
November, 2015
File:
PDF, 1.10 MB
english, 2015
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