Commercial Silicon Nitride Powders Surface Groups Measured...

Key Engineering Materials 2004 Vol. 264-268

Commercial Silicon Nitride Powders Surface Groups Measured by Diffuse Reflectance Infrared Fourier Transform Spectroscopy

Hien, T.T.T., Ishizaki, C., Ishizaki, Kozo
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Volume:
264-268
Year:
2004
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.264-268.1119
File:
PDF, 241 KB
english, 2004
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