Stress relaxation during isothermal annealing in electroplated Cu films
Soo-Jung Hwang, Young-Chang Joo, Junichi KoikeVolume:
516
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.tsf.2008.03.030
File:
PDF, 1020 KB
english, 2008