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Degradation effects in the one-band-tunneling Au/CaF2/n-Si(111) MIS structures
M.I. Vexler, S.M. Suturin, S.E. Tyaginov, A.G. Banshchikov, N.S. SokolovVolume:
516
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2008.06.040
File:
PDF, 312 KB
english, 2008