Characterization of oxidized gallium droplets on silicon...

Thin Solid Films 2009 Vol. 517; Iss. 6

Characterization of oxidized gallium droplets on silicon surface: An ellipsoidal droplet shape model for angle resolved X-ray photoelectron spectroscopy analysis

Jan Čechal, Tomáš Matlocha, Josef Polčák, Miroslav Kolíbal, Ondřej Tomanec, Radek Kalousek, Petr Dub, Tomáš Šikola
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
517
Year:
2009
Language:
english
Pages:
7
DOI:
10.1016/j.tsf.2008.10.011
File:
PDF, 1.24 MB
english, 2009
Conversion to is in progress
Conversion to is failed