On the Sensitivity of Optical Reflectivity Spectra to the...

Materials Science Forum 1994 Vol. 143-147

On the Sensitivity of Optical Reflectivity Spectra to the Bulk Defects in Semiconductors - Example of Crystalline Si

Iwanowski, Ryszard, Kowalski, B.J., Orłowski, B.A., Bak-Misiuk, Jadwiga
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Volume:
143-147
Year:
1994
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.143-147.183
File:
PDF, 313 KB
1994
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