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An accurate and fast reliability analysis method for combinational circuits
Zandevakili, Hamed, Mahani, Ali, Saneei, MohsenVolume:
34
Language:
english
Journal:
COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
DOI:
10.1108/COMPEL-06-2014-0137
Date:
May, 2015
File:
PDF, 460 KB
english, 2015