Negative bias–temperature stress in non-self-aligned...

Thin Solid Films 2009 Vol. 517; Iss. 23

Negative bias–temperature stress in non-self-aligned p-channel polysilicon TFTs

L. Mariucci, P. Gaucci, A. Valletta, M. Cuscunà, L. Maiolo, A. Pecora, G. Fortunato
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Volume:
517
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2009.02.089
File:
PDF, 369 KB
english, 2009
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