Electronic and structural properties of the...

Thin Solid Films 2009 Vol. 517; Iss. 23

Electronic and structural properties of the amorphous/crystalline silicon interface

J.P. Kleider, R. Chouffot, A.S. Gudovskikh, P. Roca i Cabarrocas, M. Labrune, P.-J. Ribeyron, R. Brüggemann
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Volume:
517
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.tsf.2009.02.092
File:
PDF, 443 KB
english, 2009
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