Reliability analysis of transparent conductive tracks...

Thin Solid Films 2009 Vol. 517; Iss. 23

Reliability analysis of transparent conductive tracks embossed in ZnO and Al-ZnO sol–gel materials

J. Rao, R.J. Winfield, S. O'Brien, G.M. Crean
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Volume:
517
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2009.02.099
File:
PDF, 671 KB
english, 2009
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