X-ray textural and microstructural characterisations by...

Thin Solid Films 2009 Vol. 517; Iss. 23

X-ray textural and microstructural characterisations by using the Combined Analysis Approach for the optical optimisation of micro- and nano-structured thin films

M. Morales, D. Chateigner, L. Lutterotti
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Volume:
517
Year:
2009
Language:
english
Pages:
7
DOI:
10.1016/j.tsf.2009.02.104
File:
PDF, 677 KB
english, 2009
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