Stability of indium-oxide thin-film transistors by reactive ion beam assisted deposition
Y. Vygranenko, K. Wang, R. Chaji, M. Vieira, J. Robertson, A. NathanVolume:
517
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2009.02.108
File:
PDF, 268 KB
english, 2009