Crystallinity and surface roughness dependent...

Thin Solid Films 2009 Vol. 517; Iss. 17

Crystallinity and surface roughness dependent photoluminescence of Y1 − xGdxVO4:Eu3+ thin films grown on Si (100) substrate

Kyoo Sung Shim, Hyun Kyoung Yang, Byung Kee Moon, Byung Chun Choi, Jung Hyun Jeong, Jong Soung Bae, Kwang Ho Kim
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Volume:
517
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2009.03.005
File:
PDF, 631 KB
english, 2009
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