On the structure and characterization of Al, Sc-co-doped...

Thin Solid Films 2009 Vol. 517; Iss. 17

On the structure and characterization of Al, Sc-co-doped ZnO-films varying with 0–2.37 wt.% Sc contents

Jing-Chie Lin, Kun-Cheng Peng, Tai-You Yeh, Sheng-Long Lee
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Volume:
517
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2009.03.022
File:
PDF, 441 KB
english, 2009
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