The measurement of surface roughness of optical thin films...

Thin Solid Films 2009 Vol. 517; Iss. 17

The measurement of surface roughness of optical thin films based on fast Fourier transform

Chuen-Lin Tien, Huei-Min Yang, Ming-Chung Liu
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Volume:
517
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.tsf.2009.03.193
File:
PDF, 534 KB
english, 2009
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