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Generation of Stacking Faults in Highly Doped n-Type 4H-SiC Substrates
Zhang, M., McD. Hobgood, H., Treu, Michael, Pirouz, P.Volume:
457-460
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.457-460.759
File:
PDF, 593 KB
english, 2004