Generation of Stacking Faults in Highly Doped n-Type 4H-SiC...

Generation of Stacking Faults in Highly Doped n-Type 4H-SiC Substrates

Zhang, M., McD. Hobgood, H., Treu, Michael, Pirouz, P.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
457-460
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.457-460.759
File:
PDF, 593 KB
english, 2004
Conversion to is in progress
Conversion to is failed