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Investigation of Deep Levels and Carrier Dynamics in SiC Films
Petrauskas, M., Bikbayev, V., Tomasiunas, R., Willander, Magnus, Wahab, Qamar-ulVolume:
32-33
Year:
1993
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.32-33.225
File:
PDF, 317 KB
1993