X-ray Photoelectron Spectroscopy characterization of native...

Thin Solid Films 2010 Vol. 518; Iss. 10

X-ray Photoelectron Spectroscopy characterization of native and RCA-treated Si (111) substrates and their influence on surface chemistry of copper phthalocyanine thin films

M. Krzywiecki, L. Grządziel, H. Peisert, I. Biswas, T. Chassé, J. Szuber
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Volume:
518
Year:
2010
Language:
english
Pages:
7
DOI:
10.1016/j.tsf.2009.09.013
File:
PDF, 858 KB
english, 2010
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