Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells
M.F. Saenger, J. Sun, M. Schädel, J. Hilfiker, M. Schubert, J.A. WoollamVolume:
518
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2009.09.042
File:
PDF, 568 KB
english, 2010