Spectroscopic ellipsometry characterization of SiNx...

Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells

M.F. Saenger, J. Sun, M. Schädel, J. Hilfiker, M. Schubert, J.A. Woollam
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Volume:
518
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2009.09.042
File:
PDF, 568 KB
english, 2010
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