The effect of stress on the dielectric constants of...

Thin Solid Films 2010 Vol. 518; Iss. 20

The effect of stress on the dielectric constants of Bi4Ti3O12 films

Liben Li, Qingdong Chen, Jinghan You, Zhengxin Tang
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Volume:
518
Year:
2010
Language:
english
Pages:
3
DOI:
10.1016/j.tsf.2009.10.035
File:
PDF, 293 KB
english, 2010
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