[ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] ECS Transactions - Characterization and Modeling of the Electrical Behavior and Threshold Voltage of the Nanocrystalline GZO Delta-doped ZnO TFTs
Hsiao, Shih-Hua, Liu, Kuang Chung, Chiang, Hung-Li, Su, Liang Yu, Peng, Lung Han, Huang, JianJangYear:
2009
Language:
english
DOI:
10.1149/1.3204416
File:
PDF, 476 KB
english, 2009