Interface analysis of Ge ultra thin layers intercalated...

Interface analysis of Ge ultra thin layers intercalated between GaAs substrates and oxide stacks

Alessandro Molle, Luca Lamagna, Sabina Spiga, Marco Fanciulli, Guy Brammertz, Marc Meuris
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Volume:
518
Year:
2010
Language:
english
Pages:
1
DOI:
10.1016/j.tsf.2009.10.069
File:
PDF, 800 KB
english, 2010
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