Texture investigation in the trench depth direction of very...

Texture investigation in the trench depth direction of very fine copper wires less than 100 nm wide using electron backscatter diffraction

Khyoupin Khoo, Jin Onuki
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Volume:
518
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2009.11.022
File:
PDF, 349 KB
english, 2010
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