Lattice Parameter Measurements of 3C-SiC Thin Films Grown...

Lattice Parameter Measurements of 3C-SiC Thin Films Grown on 6H-SiC(0001) Substrate Crystals

Kräußlich, J., Bauer, Anton J., Wunderlich, B., Goetz, K.
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Volume:
353-356
Year:
2001
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.353-356.319
File:
PDF, 299 KB
2001
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