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Lattice Parameter Measurements of 3C-SiC Thin Films Grown on 6H-SiC(0001) Substrate Crystals
Kräußlich, J., Bauer, Anton J., Wunderlich, B., Goetz, K.Volume:
353-356
Year:
2001
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.353-356.319
File:
PDF, 299 KB
2001