Study on Sub-Pixel Techniques for Accurate Image...

Study on Sub-Pixel Techniques for Accurate Image Measurement of Displacement

Xie, Zhe Dong, Zhang, Xin Jie
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Volume:
301-303
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.301-303.1042
Date:
July, 2011
File:
PDF, 361 KB
english, 2011
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