Comparison between Different Schottky Diode Edge Termination Structures: Simulations and Experimental Results
La Via, Francesco, Roccaforte, Fabrizio, Di Franco, Salvatore, Raineri, Vito, Moscatelli, Francesco, Scorzoni, Andrea, Cardinali, G.C.Volume:
433-436
Year:
2003
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.433-436.827
File:
PDF, 360 KB
english, 2003