Optical and nuclear characterization of Xe-induced...

Thin Solid Films 2010 Vol. 518; Iss. 16

Optical and nuclear characterization of Xe-induced nanoporosity in SiO2

A. Naas, D. De Sousa-Meneses, B. Hakim, G. Regula, M.F. Beaufort, A. Belaidi, E. Ntsoenzok
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Volume:
518
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2009.12.068
File:
PDF, 728 KB
english, 2010
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