Tight Binding Calculations of Optical Cross Sections for...

Tight Binding Calculations of Optical Cross Sections for Deep Level Defects in Semiconductors

Petit, J., Allan, G., Lannoo, Michel
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Volume:
10-12
Year:
1986
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.10-12.67
File:
PDF, 246 KB
1986
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