Raman study of stress effect on Ge nanocrystals embedded in...

Thin Solid Films 2010 Vol. 518; Iss. 19

Raman study of stress effect on Ge nanocrystals embedded in Al2O3

S.R.C. Pinto, A.G. Rolo, A. Chahboun, R.J. Kashtiban, U. Bangert, M.J.M. Gomes
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Volume:
518
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2010.03.035
File:
PDF, 693 KB
english, 2010
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