Fatigue Crack Propagation between Holes or Ingredients

Fatigue Crack Propagation between Holes or Ingredients

Cho, J.U., Kim, Seok Cheol, Lee, Ouk Sub
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Volume:
51-52
Year:
1991
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.51-52.221
File:
PDF, 362 KB
1991
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