MOCVD growth of GaN layer on InN interlayer and relaxation of residual strain
Keon-Hun Lee, Sung Hyun Park, Jong Hack Kim, Nam Hyuk Kim, Min Hwa Kim, Hyunseok Na, Euijoon YoonVolume:
518
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2010.03.155
File:
PDF, 536 KB
english, 2010