Epitaxial EuO thin films by pulsed laser deposition monitored by in situ x-ray photoelectron spectroscopy
J.N. Beukers, J.E. Kleibeuker, G. Koster, D.H.A. Blank, G. Rijnders, H. Hilgenkamp, A. BrinkmanVolume:
518
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2010.04.071
File:
PDF, 242 KB
english, 2010