Correlation between structural and opto-electronic...

Thin Solid Films 2010 Vol. 518; Iss. 20

Correlation between structural and opto-electronic properties of a-Si1 − xCx:H films deposited by plasma enhanced chemical vapour deposition

G. Ambrosone, D.K. Basa, U. Coscia, P. Rava
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Volume:
518
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2010.05.089
File:
PDF, 420 KB
english, 2010
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