Thickness dependence of strain and in-plane dielectric...

Thin Solid Films 2010 Vol. 518; Iss. 21

Thickness dependence of strain and in-plane dielectric properties of highly (001) oriented (Ba,Sr)TiO3 thin films

Shengbo Lu, Zhenkui Xu, Jiwei Zhai
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Volume:
518
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2010.05.091
File:
PDF, 525 KB
english, 2010
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