Characterization of magnetoresistance hysteresis of...

Thin Solid Films 2010 Vol. 519; Iss. 1

Characterization of magnetoresistance hysteresis of Permalloy thin-film using near-field microwave microscope

Harutyun Melikyan, Arsen Babajanyan, Neun Jong Lee, Tae Hee Kim, Hanju Lee, Kiejin Lee, Barry Friedman
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Volume:
519
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2010.07.024
File:
PDF, 973 KB
english, 2010
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