SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] X-Ray and EUV/FUV Spectroscopy and Polarimetry - Calibration of the EIT instrument for the SOHO mission
Defise, Jean-Marc, Song, Xueyan, Delaboudiniere, Jean-Pierre, Artzner, Guy E., Carabetian, Charles, Hochedez, Jean-Francois E., Brunaud, Jacqueline, Moses, J. Daniel, Catura, Richard C., Clette, FredeVolume:
2517
Year:
1995
Language:
english
DOI:
10.1117/12.224924
File:
PDF, 599 KB
english, 1995