Ellipsometric studies on ZnO:Al thin films: Refinement of...

Ellipsometric studies on ZnO:Al thin films: Refinement of dispersion theories

Nicole Ehrmann, Rolf Reineke-Koch
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Volume:
519
Year:
2010
Language:
english
Pages:
11
DOI:
10.1016/j.tsf.2010.09.057
File:
PDF, 1.42 MB
english, 2010
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