Structural and photocarrier radiometric characterization of...

Thin Solid Films 2011 Vol. 519; Iss. 7

Structural and photocarrier radiometric characterization of Cux(CdTe)yOz thin films growth by reactive sputtering

R. Velazquez-Hernandez, I. Rojas-Rodriguez, J. Carmona-Rodríguez, S. Jiménez-Sandoval, M.E. Rodriguez-Garcia
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Volume:
519
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.tsf.2010.11.011
File:
PDF, 1.04 MB
english, 2011
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