Testing field and annealing temperature dependence of leakage properties in Bi3.25La0.75Ti3O12 thin films
Xiumei Wu, Shuai Dong, Ya Zhai, Mingxiang Xu, Yi KanVolume:
519
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2010.11.021
File:
PDF, 710 KB
english, 2011