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Spectroscopic ellipsometry study of CuCdTeO thin films grown by reactive co-sputtering
A. Mendoza-Galván, S. Jiménez-Sandoval, J. Carmona-RodríguezVolume:
519
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2010.11.090
File:
PDF, 376 KB
english, 2011