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Annealing effects of In2O3 thin films on electrical properties and application in thin film transistors
Zijian Yuan, Xiaming Zhu, Xiong Wang, Xikun Cai, Bingpo Zhang, Dongjiang Qiu, Huizhen WuVolume:
519
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2010.12.022
File:
PDF, 729 KB
english, 2011