Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry
F. Barroso, S. Bosch, N. Tort, O. Arteaga, J. Sancho-Parramon, E. Jover, E. Bertran, A. CanillasVolume:
519
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2010.12.051
File:
PDF, 491 KB
english, 2011