Combination of synchrotron ellipsometry and table-top...

Thin Solid Films 2011 Vol. 519; Iss. 9

Combination of synchrotron ellipsometry and table-top optical measurements for determination of band structure of DLC films

Daniel Franta, David Nečas, Lenka Zajíčková, Vilma Buršíková, Christoph Cobet
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Volume:
519
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2010.12.059
File:
PDF, 612 KB
english, 2011
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