An imaging approach for the automatic thresholding of photo...

Pattern Recognition Letters 2015 / 08 Vol. 60-61

An imaging approach for the automatic thresholding of photo defects

Bhardwaj, Neelam, Agarwal, Suneeta, Bhardwaj, Vikash
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Volume:
60-61
Language:
english
Journal:
Pattern Recognition Letters
DOI:
10.1016/j.patrec.2015.03.019
Date:
August, 2015
File:
PDF, 764 KB
english, 2015
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