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An imaging approach for the automatic thresholding of photo defects
Bhardwaj, Neelam, Agarwal, Suneeta, Bhardwaj, VikashVolume:
60-61
Language:
english
Journal:
Pattern Recognition Letters
DOI:
10.1016/j.patrec.2015.03.019
Date:
August, 2015
File:
PDF, 764 KB
english, 2015