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Electrical Characterization and Microstructures of Tb-Doped Bi4Ti3O12 Thin Films
Sun, Y.H., Chen, Min, An, W.K., Cai, A.H., Liu, J., Su, K.L.Volume:
368-372
Year:
2008
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.368-372.82
File:
PDF, 335 KB
english, 2008